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IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS OCTAL BUFFER/LINE DRIVER
IDT74FCT540AT/CT
FEATURES:
* * * *
DESCRIPTION:
* * * *
A and C grades Low input and output leakage 1A (max.) CMOS power levels True TTL input and output compatibility: - VOH = 3.3V (typ.) - VOL = 0.3V (typ.) High Drive outputs (-15mA IOH, 64mA IOL) Meets or exceeds JEDEC standard 18 specifications Power off disable outputs permit "live insertion" Available in SOIC, SSOP, and QSOP packages
The IDT octal buffer/line driver is built using an advanced dual metal CMOS technology. The FCT540T is similar in function to the FCT240T, except that the inputs and outputs are on opposite sides of the package. This pinout arrangement makes these devices especially useful as output ports for microprocessors and as backplane drivers, allowing ease of layout and greater board density.
FUNCTIONAL BLOCK DIAGRAM
OEA
OEB
D0 D1 D2 D3 D4 D5 D6 D7
O0 O1 O2 O3 O4 O5 O6 O7
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
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AUGUST 2000
DSC-5588/2
(c) 2000 Integrated Device Technology, Inc.
IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
ABSOLUTE MAXIMUM RATINGS(1)
Symbol VTERM(2) VTERM(3) TSTG IOUT Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max -0.5 to +7 -0.5 to VCC+0.5 -65 to +150 -60 to +120 Unit V V C mA
OEA D0 D1 D2 D3 D4 D5 D6 D7 GND
1 2 3 4 5 6 7 8 9 10
20 19 18 17 16 15 14 13 12 11
VCC OEB O0 O1 O2 O3 O4 O5 O6 O7
NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Output and I/O terminals only.
CAPACITANCE (TA = +25C, F = 1.0MHz)
Symbol CIN Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF pF COUT
SOIC/ SSOP/ QSOP TOP VIEW
NOTE: 1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names OEA, OEB Dx Ox Inputs Outputs Description 3-State Output Enable Inputs (Active LOW)
FUNCTION TABLE(1)
OEA L L H Inputs OEB L L H D L H X Outputs H L Z
NOTE: 1. H = HIGH Voltage Level X = Don't Care L = LOW Voltage Level Z = High Impedance
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IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Industrial: TA = -40C to +85C, VCC = 5.0V 5%
Symbol VIH VIL IIH IIL IOZH IOZL II VIK VH ICC Parameter Input HIGH Level Input LOW Level Input HIGH Current(4) Input LOW Current(4) High Impedance Output Current(4) (3-State Output pins)(4) Input HIGH Current(4) Clamp Diode Voltage Input Hysteresis Quiescent Power Supply Current VCC = Max. VIN = GND or VCC VCC = Max., VI = VCC (Max.) VCC = Min., IIN = -18mA -- Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VCC = Max. VCC = Max. VI = 2.7V VI = 0.5V VI = 2.7V VI = 0.5V Min. 2 -- -- -- -- -- -- -- -- -- Typ.(2) -- -- -- -- -- -- -- -0.7 200 0.01 Max. -- 0.8 1 1 1 1 1 -1.2 -- 1 A V mV mA Unit V V A A A
OUTPUT DRIVE CHARACTERISTICS
Symbol VOH VOL IOS Parameter Output HIGH Voltage Output LOW Voltage Short Circuit Current VCC = Min VIN = VIH or VIL VCC = Min VIN = VIH or VIL Test Conditions(1) IOH = -8mA IOH = -15mA IOL = 64mA Min. 2.4 2 -- -60 Typ.(2) 3.3 3 0.3 -120 Max. -- -- 0.55 -225 Unit V V mA
VCC = Max., VO = GND(3)
NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. The test limit for this parameter is 5A at TA = -55C.
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IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol ICC ICCD Parameter Quiescent Power Supply Current TTL Inputs HIGH Dynamic Power Supply Current(4) VCC = Max. VIN = 3.4V(3) VCC = Max. Outputs Open OEA = OEB = GND One Input Toggling 50% Duty Cycle IC Total Power Supply Current(6) VCC = Max. Outputs Open fi = 10MHz 50% Duty Cycle OEA = OEB = GND One Bit Toggling VCC = Max. Outputs Open fi = 2.5MHz 50% Duty Cycle OEA = OEB = GND Four Bits Toggling VIN = VCC VIN = GND VIN = 3.4V VIN = GND VIN = VCC VIN = GND VIN = 3.4V VIN = GND -- 1.5 3.5 mA VIN = VCC VIN = GND Test Conditions(1) Min. -- -- Typ.(2) 0.5 0.15 Max. 2 0.25 Unit mA mA/ MHz
--
1.8
4.5
--
3
6(5)
mA
--
5
14(5)
NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient. 3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ICC DHNT + ICCD (fiNi) ICC = Quiescent Current ICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) fi = Output Frequency Ni = Number of Outputs at fO All currents are in milliamps and all frequencies are in megahertz.
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT540AT Symbol tPLH tPHL tPZH tPZL tPHZ tPLZ Parameter Propagation Delay Dx to Ox Output Enable Time Output Disable Time Condition(1) CL = 50pF RL = 500 Min.(2) 1.5 1.5 1.5 Max. 4.8 6.2 5.6 Min.(2) 1.5 1.5 1.5 FCT540CT Max. 4.3 5.8 5.2 Unit
ns ns ns
NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays.
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IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
V CC 7.0V 500 VIN Pulse G enerator D.U.T. 50pF RT 500 C
L
SWITCH POSITION
Test Switch Closed Open Open Drain Disable Low Enable Low All Other Tests
V O UT
DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Octal link
Test Circuits for All Outputs
DATA INPUT tSU TIMING INPUT ASYNCHRO NOUS CONTROL PRESET CLEAR ETC. SYNCHRON OUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tREM tH
3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V
Octal link
LOW -HIGH-LOW PULSE tW HIG H-LOW -HIGH PULSE
Octal link
1.5V
1.5V
tSU
tH
Pulse Width
Set-Up, Hold, and Release Times
ENABLE SAM E PHASE INPUT TRANSITIO N tPLH O UTPUT tPLH OPPOSITE PHASE INPUT TRANSITIO N tPHL tPHL 3V 1.5V 0V VOH 1.5V VOL 3V 1.5V 0V
Octal link
DISABLE 3V
CONTRO L INPUT tPZL OUTPUT NO RMALLY LOW SW ITCH CLOSED tPZH OUTPUT NO RMALLY HIGH SW ITCH OPEN 3.5V 1.5V 0.3V tPHZ 0.3V 1.5V 0V tPLZ
1.5V 0V 3.5V VOL VOH
0V
Octal link
Propagation Delay
Enable and Disable Times
NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns.
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IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT XX Temperature Range FCT X Device Type X Package
SO PY Q
Small Outline IC Shrink Small Outline Package Quarter-size Small Outline Package
540AT Fast CMOS Octal Buffer/Line Driver 540CT
74
- 40C to +85C
CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054
for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com
for Tech Support: logichelp@idt.com (408) 654-6459
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